Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/30/2005
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Application #:
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10287326
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Filing Dt:
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11/04/2002
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Inventors:
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Kevin Weaver, Zachary Joshua Gemmill, Steven Jacobson
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Title:
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NON-DESTRUCTIVE METHOD OF MEASURING THE THICKNESS OF A SEMICONDUCTOR WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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2900 SEMICONDUCTOR DRIVE, M/S D3-579 |
SANTA CLARA, CALIFORNIA 95051-8090 |
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LAW OFFICES OF MARK C. PICKERING |
MARK C. PICKERING, ESQ. |
PO BOX 300 |
PETALUMA, CA 94953-0300 |
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