Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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09/27/2005
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Application #:
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10706972
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Filing Dt:
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11/14/2003
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Publication #:
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Pub Dt:
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08/05/2004
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Inventors:
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Shunzo Yamashita, Toshiyuki Aritsuka, Kei Suzuki, Sadaki Nakano
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Title:
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QUALITY MONITORING SYSTEM FOR BUILDING STRUCTURE, QUALITY MONITORING METHOD FOR BUILDING STRUCTURE AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, TOKYO, JAPAN |
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| ANTONELLI TERRY STOUT & KRAUS, LLP |
| MELVIN KRAUS |
| 1300 NORTH 17TH STREET |
| SUITE 1800 |
| ARLINGTON, VA 22209 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6-6, MARUNOUCHI 1-CHOME |
| CHIYODA-KU, TOKYO, JAPAN |
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| ANTONELLI, TERRY, STOUT & KRAUS, LLP |
| 1300 NORTH 17TH STREET, SUITE 1800 |
| ARLINGTON, VIRGINIA 22209 |
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