Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/25/2006
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Application #:
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11044771
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Filing Dt:
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01/26/2005
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Inventors:
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Vitali Souchkov, Vladimir Faifer, Alexander Artjomov, Eugene Fukshansky et al
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Title:
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APPARATUS FOR MEASURING OF THIN DIELECTRIC LAYER PROPERTIES ON SEMICONDUCTOR WAFERS WITH CONTACT SELF ALIGNING ELECTRODES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1631 NORTH FIRST STREET |
| SAN JOSE, CALIFORNIA 95112 |
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| ANN KOO |
| 1631 NORTH FIRST STREET |
| SAN JOSE, CA 95112 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 199 RIVER OAKS PARKWAY |
| SAN JOSE, CALIFORNIA 85134 |
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| MASCHOFF BRENNAN |
| 1389 CENTER DRIVE |
| SUITE 300 |
| PARK CITY, UT 84098 |
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