Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/16/2006
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Application #:
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10479726
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Filing Dt:
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12/05/2003
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Publication #:
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Pub Dt:
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09/09/2004
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Inventor:
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Toru Ibane
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Title:
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METHOD FOR CALIBRATING SEMICONDUCTOR TEST INSTRUMENT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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32-1, ASAHICHO 1-CHOME, NERIMA-KU |
TOKYO, JAPAN |
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DELLETT & WALTERS |
JAMES H. WALTERS |
310 SW 4TH AVE. |
STE. 1101 |
PORTLAND, OR 97204-2304 |
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