Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/18/2006
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Application #:
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10507042
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Filing Dt:
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09/07/2004
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Publication #:
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Pub Dt:
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07/07/2005
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Inventor:
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Hideyuki Oshima
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Title:
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SEMICONDUCTOR TEST APPARATUS FOR TESTING SEMICONDUCTOR DEVICE THAT PRODUCES OUTPUT DATA BY ITS INTERNAL CLOCK TIMING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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32-1, ASAHICHO 1-CHOME, NERIMA-KU |
TOKYO, JAPAN 179-0071 |
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YASUO MURAMATSU |
MURAMATSU & ASSOCIATES |
7700 IRVINE CENTER DRIVE, SUITE 225 |
IRVINE, CA 92618 |
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