Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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07/18/2006
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Application #:
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10379738
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Filing Dt:
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03/05/2003
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Inventors:
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Bryan Choo, Bharath Rangarajan, Carmen Morales, Bhanwar Singh
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Title:
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CONCURRENT MEASUREMENT OF CRITICAL DIMENSION AND OVERLAY IN SEMICONDUCTOR MANUFACTURING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE AMD PLACE, P.O. BOX 3453 |
| SUNNYVALE, CALIFORNIA 94088 |
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| AMIN & TUROCY, LLP |
| HIMANSHU S. AMIN |
| 24TH FLOOR, NATIONAL CITY CETNER |
| 1900 E. 9TH STREET |
| CLEVELAND, OH 44114 |
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Assignment:
2
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SECURITY INTEREST (SEE DOCUMENT FOR DETAILS).
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| 121 W. LONG LAKE ROAD |
| SUITE 300 |
| BLOOMFIELD HILLS, MICHIGAN 48304 |
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| CHRISTOPHER J. RECKAMP |
| 311 S. WACKER DRIVE |
| FAEGRE BAKER DANIELS LLP |
| CHICAGO, IL 60606 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 121 W. LONG LAKE ROAD |
| BLOOMFIELD HILLS, MICHIGAN 48304 |
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| FENG XU |
| 1526 GILPIN AVENUE |
| WILMINGTON, DE 19806 |
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Assignment:
4
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 717 N. UNION STREET |
| WILMINGTON, DELAWARE 19805 |
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| JENNIFER PICINI |
| 1526 GILPIN AVE. |
| WILMINGTON, DE 19806 |
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