Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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08/08/2006
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Application #:
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10468899
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Filing Dt:
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10/01/2003
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Publication #:
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Pub Dt:
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04/08/2004
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Inventors:
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Makoto Ebata, Fusao Fujita, Makoto Saito
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Title:
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FILM THICKNESS MEASURING MONITOR WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6-4, TSUKIJI 5-CHOME, CHUO-KU |
| TOKYO, JAPAN 104-8439 |
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| 3-16-2, TAMAHARA, TAMANO-SHI |
| OKAYAMA, JAPAN 706-0014 |
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| OLIFF & BERRIDGE, PLC |
| JAMES A. OLIFF |
| P.O. BOX 19928 |
| ALEXANDRIA, VA 22320 |
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Assignment:
2
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CHANGE OF NAME AND COMPANY SPLIT
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| 6-4, TSUKIJI 5-CHOME, CHUO-KU |
| TOKYO, JAPAN |
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| OLIFF PLC |
| P.O. BOX 320850 |
| ALEXANDRIA, VA 22320-4850 |
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