Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/08/2006
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Application #:
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10709805
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Filing Dt:
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05/28/2004
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Publication #:
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Pub Dt:
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12/01/2005
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Inventors:
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Jeanne P. Bickford, Vernon R. Norman, Michael R. Ouellette, Mark S. Styduhar et al
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Title:
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METHOD AND SYSTEM FOR PROVIDING QUALITY CONTROL ON WAFERS RUNNING ON A MANUFACTURING LINE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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NEW ORCHARD RD. |
ARMONK, NEW YORK 10504 |
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DILLON & YUDELL LLP |
8911 NO. CAPITAL OF TEXAS HWY., SUITE 21 |
AUSTIN, TX 78759 |
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