Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/31/2006
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Application #:
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10761749
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Filing Dt:
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01/21/2004
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Publication #:
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Pub Dt:
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07/21/2005
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Inventor:
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Justin Hwu
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Title:
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METHOD FOR PATTERN RECOGNITION IN ENERGIZED CHARGE PARTICLE BEAM WAFER/SLIDER INSPECTION/MEASUREMENT SYSTEMS IN PRESENCE OF ELECTRICAL CHARGE
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Assignment:
1
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CORRECTION AN EXECUTION WAS NEEDED
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| 1076 AZ AMSTERDAM |
| P.O. BOX 75215 |
| 1070 AE AMSTERDAM, NETHERLANDS |
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| HITACHI GLOBAL STORAGE TECHNOLOGIES |
| INTELLECTUAL PROPERTY LAW |
| 5600 COTTLE ROAD, DEPT. NHGB/014-2 |
| SAN JOSE, CA 95193 |
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