Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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12/19/2006
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Application #:
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11071339
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Filing Dt:
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03/02/2005
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Publication #:
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Pub Dt:
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09/08/2005
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Inventors:
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Tal Raichman, Peter P. Cuevas, James Borthwick, Michael A. Casolo
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Title:
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DUAL CHANNEL SOURCE MEASUREMENT UNIT FOR SEMICONDUCTOR DEVICE TESTING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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915 WALSH AVENUE |
SANTA CLARA, CALIFORNIA 95050 |
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BEYER WEAVER & THOMAS LLP |
P.O. BOX 70250 |
OAKLAND, CA 94612-0250 |
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Assignment:
2
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RE-RECORD TO CORRECT THE SECOND LISTED INVENTOR' LAST NAME PREVIOUSLY RECORDED AT REEL/FRAME 016347/0796
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915 WALSH AVENUE |
SANTA CLARA, CALIFORNIA 95050 |
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BEYER WEAVER & THOMAS LLP |
P.O. BOX 70250 |
OAKLAND, CA 94612-0250 |
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