Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/27/2007
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Application #:
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10936392
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Filing Dt:
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09/08/2004
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Publication #:
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Pub Dt:
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02/10/2005
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Inventor:
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Hirokatsu Niijima
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Title:
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SEMICONDUCTOR TEST DEVICE AND TIMING MEASUREMENT METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-32-1 ASAHI-CHO NERIMA-KU |
| TOKYO, JAPAN 179-0071 |
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| OSHA & MAY, LLP |
| JONATHAN P. OSHA |
| 1221 MCKINNEY ST., SUITE 2800 |
| HOUSTON, TX 77010 |
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