Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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10/16/2007
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Application #:
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11099114
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Filing Dt:
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04/05/2005
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Publication #:
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Pub Dt:
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10/05/2006
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Inventor:
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William H. Howland JR.
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Title:
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METHOD OF MEASURING SEMICONDUCTOR WAFERS WITH AN OXIDE ENHANCED PROBE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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110 TECHNOLGOGY DRIVE |
PITTSBURGH, PENNSYLVANIA 15275 |
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WEBB ZIESENHEIM LOGSDON |
WILLIAM H. LOGSDON |
700 KOPPERS BUILDING |
436 SEVENTH AVENUE |
PITTSBURGH, PA 15219-1818 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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PRIELLE KORNELIA U. 2. |
BUDAPEST, HUNGARY 1117 |
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THE WEBB LAW FIRM PC |
ONE GATEWAY CENTER, 420 FT. DUQUESNE BLV |
SUITE 1200 |
PITTSBURGH, PA 15222 |
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