Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/04/2007
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Application #:
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10644001
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Filing Dt:
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08/20/2003
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Publication #:
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Pub Dt:
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05/20/2004
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Inventor:
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Takahiro Ikeda
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Title:
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EXTRACTING METHOD OF PATTERN CONTOUR, IMAGE PROCESSING METHOD, SEARCHING METHOD OF PATTERN EDGE, SCANNING METHOD OF PROBE, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, PATTERN INSPECTION APPARATUS, AND PROGRAM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, SHIBAURA 1-CHOME |
| MINATO-KU, TOKYO, JAPAN |
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| FINNEGAN HENDERSON FARABOW ET AL. |
| ERNEST F. CHAPMAN |
| 1300 I STREET, N.W. |
| WASHINGTON, DC 20005-3315 |
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