Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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02/05/2008
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Application #:
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10606199
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Filing Dt:
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06/26/2003
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Publication #:
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Pub Dt:
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03/04/2004
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Inventors:
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Yoel Cohen, Moshe Finarov, Klara Vinokur
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Title:
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THIN FILMS MEASUREMENT METHOD AND SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| WEIZMANN SCIENTIFIC PARK |
| P.O.B. 266 |
| REHOVOT 76100, ISRAEL |
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| NATH & ASSOCIATES |
| GARY M. NATH |
| 1030 15TH STREET, N.W. |
| 6TH FLOOR |
| WASHINGTON, DC 20005 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 5 DAVID FIKES ST. |
| REHOVOT 7632805, ISRAEL |
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| DANIEL M. GURFINKEL |
| DENNEMEYER & ASSOCIATES, LLC |
| 2 NORTH RIVERSIDE PLAZA, SUITE 1500 |
| CHICAGO, IL 60606 |
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