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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
04/15/2008
Application #:
11402357
Filing Dt:
04/12/2006
Inventors:
Gregory J. Steckman, Frank Havermeyer, Lawrence Pokwah Ho
Title:
METHOD AND APPARATUS FOR WAFER-LEVEL MEASUREMENT OF VOLUME HOLOGRAPHIC GRATINGS
Assignment: 1
Reel/Frame:
017765/0427Recorded: 04/12/2006Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
04/11/2006
Exec Dt:
04/11/2006
Exec Dt:
04/11/2006
Assignee:
850 EAST DUARTE ROAD
MONROVIA, CALIFORNIA 91016
Correspondent:
CHRISTOPHE MOSER
850 EAST DUARTE ROAD
MONROVIA, CA 91016
Assignment: 2
Reel/Frame:
062979/0080Recorded: 03/14/2023Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/16/2022
Assignee:
5100 PATRICK HENRY DRIVE
SANTA CLARA, CALIFORNIA 95054
Correspondent:
JOSHUA A. CRAWFORD
C/O MORRISON & FOERSTER LLP
2100 L STREET, NW SUITE 900
WASHINGTON, DC 20037

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