Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/22/2008
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Application #:
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11020492
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Filing Dt:
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12/21/2004
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Publication #:
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Pub Dt:
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04/20/2006
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Inventor:
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Chang-Hyuk Lee
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Title:
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MEMORY CELL TEST CIRCUIT FOR USE IN SEMICONDUCTOR MEMORY DEVICE AND ITS METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SAN 136-1, AMI-RI, BUBAL-EUB, ICHON-SHI |
| KYOUNGKI-DO, KOREA, REPUBLIC OF |
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| BLAKELY, SOKOLOFF, TAYLOR & ZAFAMN LLP |
| ERIC S. HYMAN |
| 12400 WILSHIRE BOULEVARD |
| 7TH FLOOR |
| LOS ANGELES, CA 90025 |
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