Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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05/20/2008
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Application #:
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10711424
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Filing Dt:
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09/17/2004
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Publication #:
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Pub Dt:
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04/21/2005
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Inventors:
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Wolfgang Vollrath, Frank Hillmann, Gerd Scheuring, Hans-Jurgen Brueck
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Title:
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APPARATUS FOR MEASURING FEATURE WIDTHS ON MASKS FOR THE SEMICONDUCTOR INDUSTRY
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Assignment:
1
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| ERNST-LEITZ-STRASSE 17-37 |
| WETZLAR, GERMANY D-35578 |
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| WILDERMUTHSTRASSE 88 |
| MUENCHEN, GERMANY D-80993 |
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| ROBERT P. SIMPSON, ESQ. |
| SIMPSON & SIMPSON, PLLC |
| 5555 MAIN STREET |
| WILLIAMSVILLE, NY 14221-5406 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| KUBACHER WEG 4 |
| WEILBURG, GERMANY 35781 |
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| C. RICHARD LOHRMAN |
| 5555 MAIN STREET |
| SIMPSON & SIMPSON, PLLC |
| WILLIAMSVILLE, NY 14221 |
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Assignment:
3
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| KUBACHER WEG 4 |
| WEILBURG, GERMANY 35781 |
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| C. RICHARD LOHRMAN |
| 5555 MAIN STREET |
| SIMPSON & SIMPSON, PLLC |
| WILLIAMSVILLE, NY 14221 |
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Assignment:
4
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| KUBACHER WEG 4 |
| WEILBURG, GERMANY 35781 |
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| C. RICHARD LOHRMAN |
| 5555 MAIN STREET |
| SIMPSON & SIMPSON, PLLC |
| WILLIAMSVILLE, NY 14221 |
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