Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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12/01/2009
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Application #:
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11796205
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Filing Dt:
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04/27/2007
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Inventors:
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Murti V. Salapaka, Deepak Ranjan Sahoo
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Title:
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OBSERVER BASED Q-CONTROL IMAGING METHODS FOR ATOMIC FORCE MICROSCOPY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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320 LAB OF MECHANICS |
AMES, IOWA 50011 |
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REINHART BOERNER VAN DEUREN P.C. |
2215 PERRYGREEN WAY |
ROCKFORD, IL 61107 |
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Assignment:
2
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CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
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4201 WILSON BLVD |
ROOM 1265 |
ARLINGTON, VIRGINIA 22230 |
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NATIONAL SCIENCE FOUNDATION |
4201 WILSON BLVD |
ROOM 1265 |
ARLINGTON, VA 22230 |
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