Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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02/09/2010
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Application #:
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11947206
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Filing Dt:
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11/29/2007
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Publication #:
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Pub Dt:
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07/31/2008
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Inventors:
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Stojan KANEV, Jorg Kiesewetter
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Title:
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METHOD AND APPARATUS FOR TESTING ELECTRONIC COMPONENTS WITHIN HORIZONTAL AND VERTICAL BOUNDARY LINES OF A WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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SUSS-STRASSE 1 |
SACKA, GERMANY 01561 |
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JEFF ROTHENBERG |
5 COLUMBIA CIRCLE |
ALBANY, NY 12203 |
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Assignment:
2
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MERGER (SEE DOCUMENT FOR DETAILS).
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2430 NW 206TH AVENUE |
BEAVERTON, OREGON 97006 |
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KEVIN L. RUSSELL |
601 SW SECOND AVENUE |
SUITE 1600 |
PORTLAND, OR 97204 |
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Assignment:
3
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SECURITY INTEREST IN UNITED STATES PATENTS AND TRADEMARKS
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601 MONTGOMERY STREET, SUITE 1500 |
SAN FRANCISCO, CALIFORNIA 94111 |
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STEWART WALSH |
1025 VERMONT AVE NW, SUITE 1130 |
NATIONAL CORPORATE RESEARCH, LTD |
WASHINGTON, DC 20005 |
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