Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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04/27/2010
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Application #:
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11939530
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Filing Dt:
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11/13/2007
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Publication #:
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Pub Dt:
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04/30/2009
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Inventors:
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Xuedong LIU, Zhonghua DONG, Zhong-Wei CHEN, Wei FANG
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Title:
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SYSTEM AND METHOD TO DETERMINE FOCUS PARAMETERS DURING AN ELECTRON BEAM INSPECTION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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5F, NO. 18, CREATION ROAD 1 |
HSIN-CHU, TAIWAN 300 |
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SAWYER LAW GROUP LLP |
P.O. BOX 51418 |
PALO ALTO, CA 94303 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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DE RUN 6501 |
VELDHOVEN, NETHERLANDS 5504 DR |
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FINNEGAN, HENDERSON, FARABOW, GARRETT & DUNNER LLP |
901 NEW YORK AVENUE, NW |
WASHINGTON, DC 20001 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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DE RUN 6501 |
VELDHOVEN, NETHERLANDS 5504 DR |
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FINNEGAN, HENDERSON, FARABOW, GARRETT & DUNNER LLP |
901 NEW YORK AVENUE, NW |
WASHINGTON, DC 20001 |
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