Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/08/2010
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Application #:
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11798838
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Filing Dt:
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05/17/2007
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Publication #:
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Pub Dt:
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12/27/2007
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Inventors:
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Choel-Hwyi Bae, Yong-Woon Han, Mi-Joung Lee, Sang-Deok Kwon
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Title:
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MONITORING PATTERN FOR DETECTING A DEFECT IN A SEMICONDUCTOR DEVICE AND METHOD FOR DETECTING A DEFECT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 416 MAETAN-DONG, YEONGTONG-GU |
| SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF |
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| EUGENE M. LEE |
| LEE & MORSE, P.C. |
| 3141 FAIRVIEW PARK DRIVE |
| SUITE 500 |
| FALLS CHURCH, VA 22042 |
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