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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
08/03/2010
Application #:
11314813
Filing Dt:
12/20/2005
Publication #:
Pub Dt:
02/15/2007
Inventors:
Sagar A. Kekare, Ingrid B. Peterson, Moshe E. Preil
Title:
METHODS AND SYSTEMS FOR DETECTING DEFECTS IN A RETICLE DESIGN PATTERN
Assignment: 1
Reel/Frame:
017445/0017Recorded: 04/10/2006Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/19/2005
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
DAFFER MCDANIEL, LLP
P.O. BOX 684908
AUSTIN, TX 78768-4908
Assignment: 2
Reel/Frame:
018035/0705Recorded: 03/31/2006Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/20/2006
Exec Dt:
02/21/2006
Exec Dt:
02/21/2006
Exec Dt:
02/21/2006
Exec Dt:
03/07/2006
Exec Dt:
02/21/2006
Exec Dt:
02/21/2006
Assignee:
1717 DELL AVENUE
CAMPBELL, CALIFORNIA 95008
Correspondent:
JAMES R. SHAY
650 PAGE MILL ROAD
PALO ALTO, CA 94304

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