Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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01/11/2011
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Application #:
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11521705
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Filing Dt:
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09/14/2006
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Publication #:
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Pub Dt:
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03/15/2007
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Inventors:
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Pieter Kruit, Erwin Slot, Tijs Frans Teepen, Marco Jan Wieland et al
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Title:
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LITHOGRAPHY SYSTEM, SENSOR AND MEASURING METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| LORENTZWEG 1 |
| 2628 CJ DELFT, NETHERLANDS |
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| BLAKELY, SOKOLOFF, TAYLOR & ZAFMAN LLP |
| 12400 WILSHIRE BOULEVARD, 7TH FLOOR |
| LOS ANGELES, CA 90025 |
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Assignment:
2
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COURT APPOINTMENT (SEE DOCUMENT FOR DETAILS).
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| POORTWEG 6C |
| PA DELFT, NETHERLANDS 2612 |
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| FINNEGAN, HENDERSON, FARABOW, GARRETT & DUNNER LLP |
| 901 NEW YORK AVENUE NW |
| WASHINGTON, DC 20001 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| DE RUN 6501 |
| DR VELDHOVEN, NETHERLANDS 5504 |
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| FINNEGAN, HENDERSON, FARABOW, GARRETT & DUNNER LLP |
| 901 NEW YORK AVENUE NW |
| WASHINGTON, DC 20001 |
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