Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
Total Assignments:
1
|
Patent #:
|
|
Issue Dt:
|
03/08/2011
|
Application #:
|
11858313
|
Filing Dt:
|
09/20/2007
|
Publication #:
|
|
Pub Dt:
|
03/27/2008
| | | | |
Inventors:
|
Sang-Wook WEE, Seung-Wook LEE, Ki-Man BAE, Kwang-Salk KIM
|
Title:
|
METHOD OF IDENTIFYING CRYSTAL DEFECT REGION IN MONOCRYSTALLINE SILICON USING METAL CONTAMINATION AND HEAT TREATMENT
|
|
Assignment:
1
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
274 IMSU-DONG, GUMI-SI |
GYEONGSANGBUK-DO, KOREA, REPUBLIC OF 730-724 |
|
|
|
RICHARD J. STREIT |
LADAS & PARRY, 224 SOUTH MICHIGAN AVE. |
CHICAGO, IL 60604 |
|
|
Search Results as of:
06/21/2024 10:38 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|