Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/28/2011
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Application #:
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10530157
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Filing Dt:
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03/13/2006
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Publication #:
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Pub Dt:
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08/31/2006
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Inventors:
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Gilad Almogy, Chris Talbot, Lior Levin
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Title:
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SYSTEM AND METHOD FOR DEFECT LOCALIZATION ON ELECTRICAL TEST STRUCTURES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 9 OPPENHEIMER ST. |
| REHOVOT 76236, ISRAEL |
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| TAREK N. FAHMI |
| SONNENSCHEIN NATH & ROSENTHAL LLP |
| POST OFFICE BOX 061080 |
| WACKER DRIVE STATION, SEARS TOWER |
| CHICAGO, ILLINOIS 60606-1080 |
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