Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/12/2011
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Application #:
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12206152
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Filing Dt:
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09/08/2008
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Publication #:
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Pub Dt:
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10/08/2009
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Inventors:
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Ho Jin KIM, Hyoung Bae Kim
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Title:
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SCAN STAGE FOR SEMICONDUCTOR WAFER POLLUTANT MEASUREMENT APPARATUS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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366-3 CHUJA-RI OPO-EUP, GYEONGGI-DO |
GWANGJU-SI, KOREA, REPUBLIC OF 464-909 |
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LEXYOUME IP GROUP, LLC |
5180 PARKSTONE DRIVE, SUITE 175 |
CHANTILLY, VA 20151 |
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09/26/2024 07:49 AM
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