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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
08/30/2011
Application #:
12032112
Filing Dt:
02/15/2008
Publication #:
Pub Dt:
08/28/2008
Inventors:
Kurt Lehman, Charles Chen, Ronald L. Allen, Robert Shinagawa, Anantha Sethuraman et al
Title:
METHODS AND SYSTEMS FOR MONITORING A PARAMETER OF A MEASUREMENT DEVICE DURING POLISHING, DAMAGE TO A SPECIMEN DURING POLISHING, OR A CHARACTERISTIC OF A POLISHING PAD OR TOOL
Assignment: 1
Reel/Frame:
020517/0138Recorded: 02/15/2008Pages: 9
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/06/2003
Exec Dt:
05/06/2003
Exec Dt:
05/05/2003
Exec Dt:
05/08/2003
Exec Dt:
04/28/2003
Exec Dt:
05/14/2003
Exec Dt:
04/28/2003
Exec Dt:
05/09/2003
Exec Dt:
05/30/2003
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
BAKER & MCKENZIE LLP
1114 AVENUE OF THE AMERICAS
NEW YORK, NY 10036

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