Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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09/27/2011
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Application #:
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11700838
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Filing Dt:
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02/01/2007
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Publication #:
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Pub Dt:
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08/09/2007
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Inventors:
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Muneyuki Fukuda, Tomoyasu Shojo, Atsuko Fukada, Noritsugu Takahashi
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Title:
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CHARGED PARTICLE APPARATUS, SCANNING ELECTRON MICROSCOPE, AND SAMPLE INSPECTION METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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24-14, NISHISHINBASHI 1-CHOME, MINATO-KU |
TOKYO, JAPAN |
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MATTINGLY, STANGER, MALUR & ET AL |
1800 DIAGONAL ROAD, SUITE 370 |
ALEXANDRIA, VIRGINIA 22314 |
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Assignment:
2
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CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE OF THE THIRD INVENTOR PREVIOUSLY RECORDED ON REEL 018965 FRAME 0807. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT TO HITACHI HIGH-TECHNOLOGIES CORPORATION.
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24-14, NISHISHINBASHI 1-CHOME, MINATO-KU |
TOKYO, JAPAN |
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JOHN R. MATTINGLY |
1800 DIAGONAL ROAD, SUITE 370 |
ALEXANDRIA, VA 22314 |
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