Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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11/20/2012
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Application #:
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12471227
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Filing Dt:
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05/22/2009
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Publication #:
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Pub Dt:
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09/17/2009
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Inventors:
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Ruifeng Guo, Wu-Tung Cheng, Yu Huang
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Title:
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TEST PATTERN GENERATION FOR DIAGNOSING SCAN CHAIN FAILURES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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8005 SW BOECKMAN ROAD |
WILSONVILLE, OREGON 97070-7777 |
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KLARQUIST SPARKMAN, LLP |
121 SW SALMON ST., SUITE 1600 |
PORTLAND, OR 97204 |
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Assignment:
2
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MERGER AND CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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Newly Merged Entity's New Name:
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5800 GRANITE PARKWAY, SUITE 600 |
PLANO, TEXAS 75024 |
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SIEMENS CORPORATION IP DEPT - MAIL CODE INT-244 |
3850 QUADRANGLE BOULEVARD |
ORLANDO, FL 32817 |
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