Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/25/2012
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Application #:
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12571791
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Filing Dt:
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10/01/2009
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Publication #:
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Pub Dt:
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04/08/2010
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Inventors:
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Eiji KAMIYAMA, Takehiro TSUNEMORI, Kazuhiro YAMAMOTO, Kenji AOKI
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Title:
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SYSTEM AND METHOD OF TWO-STEPPED LASER SCATTERING DEFECT INSPECTION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-1, SHIBAURA 1-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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| GREENBLUM & BERNSTEIN, P.L.C. |
| 1950 ROLAND CLARKE PLACE |
| RESTON, VA 20191 |
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