Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/22/2013
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Application #:
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12680755
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Filing Dt:
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07/12/2010
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Publication #:
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Pub Dt:
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11/11/2010
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Inventor:
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Robert John Wilby
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Title:
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SEMICONDUCTOR WAFER METROLOGY APPARATUS AND METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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UNIT 2A, MANOR PARK, NAILSEA WALL LANE |
NAILSEA, BRISTOL BS48 4DD, UNITED KINGDOM |
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STITES & HARBISON PLLC |
1199 NORTH FAIRFAX ST. |
SUITE 900 |
ALEXANDRIA, VA 22314 |
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