Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
Total Assignments:
2
|
Patent #:
|
|
Issue Dt:
|
05/07/2013
|
Application #:
|
12958420
|
Filing Dt:
|
12/02/2010
|
Publication #:
|
|
Pub Dt:
|
06/07/2012
| | | | |
Inventors:
|
John Wall, David Jacques, Boris Yokhin, Alexander Krokhmal, Paul Ryan, Richard Bytheway et al
|
Title:
|
FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS
|
|
Assignment:
1
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
P.O. BOX 103 |
MIGDAL HAEMEK, ISRAEL 23100 |
|
|
|
D. KLIGLER I.P. SERVICES LTD. |
P.O. BOX 33111 |
TEL AVIV, 61330 ISRAEL |
|
|
Assignment:
2
|
|
|
|
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
6 HAMECHKAR STREET |
P.O. BOX 103 |
MIGDAL HAEMEK, ISRAEL 2306990 |
|
|
|
KLIGLER & ASSOCIATES PATENT ATTORNEYS LTD. |
P.O. BOX 57651 |
TEL AVIV, 6157601 ISRAEL |
|
|
Search Results as of:
09/22/2024 11:08 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|