Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/15/2013
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Application #:
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12598228
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Filing Dt:
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06/30/2010
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Publication #:
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Pub Dt:
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10/21/2010
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Inventors:
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Alex Hayat, Alex Lahav, Meir Orenstein
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Title:
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FOCUSED ION BEAM DEEP NANO-PATTERNING APPARATUS AND METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| TECHNION CITY |
| HAIFA, ISRAEL ... |
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| BROWDY AND NEIMARK, PLLC |
| 1625 K STREET, N.W. |
| SUITE 1100 |
| WASHINGTON, DC 20006 |
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