Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/29/2013
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Application #:
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13714368
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Filing Dt:
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12/13/2012
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Inventors:
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Chikuang Wang, Biao Liu, Yuri Uritsky
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Title:
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MEASUREMENT SYSTEM WITH THICKNESS CALCULATION AND METHOD OF OPERATION THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3050 BOWERS AVENUE |
| SANTA CLARA, CALIFORNIA 95054 |
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| MIKIO ISHIMARU |
| ISHIMARU & ASSOCIATES LLP |
| 2055 GATEWAY PLACE, SUITE 700 |
| SAN JOSE, CA 95110 |
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