Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/05/2014
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Application #:
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11648965
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Filing Dt:
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01/03/2007
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Inventors:
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John Hench, Daniel Wack, Edward Ratner, Yaoming Shi, Andrei Veldman
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Title:
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Measuring critical dimensions of a semiconductor structure
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ONE TECHNOLOGY DRIVE |
MILPITAS, CALIFORNIA 95035 |
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OKAMOTO & BENEDICTO LLP |
P.O. BOX 641330 |
SAN JOSE, CA 95164-1330 |
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06/25/2024 04:50 PM
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