Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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09/09/2014
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Application #:
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12836538
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Filing Dt:
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07/14/2010
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Publication #:
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Pub Dt:
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06/30/2011
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Inventors:
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Tae Sik Yun, Jong Chern Lee
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Title:
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SEMICONDUCTOR APPARATUS AND PROBE TEST METHOD THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SAN 136-1, AMI-RI, BUBAL-EUB |
| ICHON-CHI, GYEONGGI-DO, KOREA, REPUBLIC OF 467-860 |
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| K. KEVIN MUN |
| 1919 GALLOWS ROAD |
| SUITE 330 |
| VIENNA, VA 22182 |
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Assignment:
2
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CORRECTIVE ASSIGNMENT TO CORRECT THE CONVEYING PARTY DATA PREVIOUSLY RECORDED ON REEL 024687 FRAME 0333. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT OF ASSIGNOR'S INTEREST.
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| SAN 136-1, AMI-RI, BUBAL-EUB |
| ICHON-SHI, GYEONGGI-DO, KOREA, REPUBLIC OF 467-860 |
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| K. KEVIN MUN |
| 1919 GALLOWS ROAD |
| SUITE 330 |
| VIENNA, VA 22182 |
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