Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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12/02/2014
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Application #:
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13486400
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Filing Dt:
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06/01/2012
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Publication #:
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Pub Dt:
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12/06/2012
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Inventors:
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Duk Kyu KWON, Kyu Han LEE, Yong Goo LEE
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Title:
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PROBE CARD FOR TESTING A SEMICONDUCTOR CHIP
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-1, SEOGU-DONG, HWASEONG-SI |
GYEONGGI-DO, KOREA, REPUBLIC OF 445-170 |
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HARNESS, DICKEY & PIERCE, P.L.C. |
7700 BONHOMME |
SUITE 400 |
ST. LOUIS, MO 63105 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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46, SAMSUNG 1-RO 5-GIL, HWASEONG-SI, GYEONGGI-DO |
HWASEONG-SI, KOREA, REPUBLIC OF |
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46, SAMSUNG 1-RO 5-GIL, HWASEONG-SI, GYEONGGI-DO |
HWASEONG-SI, KOREA, REPUBLIC OF |
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LEX IP MEISTER, PLLC |
5180 PARKSTONE DRIVE, SUITE 175 |
CHANTILLY, VA 20151 |
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Assignment:
3
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NUNC PRO TUNC ASSIGNMENT (SEE DOCUMENT FOR DETAILS).
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46, SAMSUNG 1-RO 5-GIL |
HWASEONG-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 18449 |
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CPA GLOBAL LIMITED |
CASTLE STREET , LIBERATION HOUSE |
ST HELIER, JE1 1BL JERSEY |
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