Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/10/2015
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Application #:
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13416098
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Filing Dt:
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03/09/2012
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Publication #:
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Pub Dt:
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10/25/2012
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Inventors:
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Yong Min Cho, Dong-Ryul Lee
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Title:
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METHOD OF DETECTING DEFECTS IN A SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 416, MAETAN-DONG, YEONGTONG-GU |
| SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF |
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| LEE & MORSE, P.C. |
| 3141 FAIRVIEW PARK DRIVE |
| SUITE 500 |
| FALLS CHURCH, VA 22042 |
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