Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/03/2015
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Application #:
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13244548
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Filing Dt:
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09/25/2011
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Publication #:
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Pub Dt:
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04/05/2012
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Inventor:
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Atsushi YOSHIDA
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Title:
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SEMICONDUCTOR TEST DEVICE, SEMICONDUCTOR TEST CIRCUIT CONNECTION DEVICE, AND SEMICONDUCTOR TEST METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1 TANABESHINDEN, KAWASAKI-KU |
| KAWASAKI-SHI, JAPAN 210-9530 |
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| RABIN & BERDO, P.C. |
| 1101 14TH ST. N.W. |
| SUITE 500 |
| WASHINGTON, DC 20005 |
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