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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
06/02/2015
Application #:
13337369
Filing Dt:
12/27/2011
Publication #:
Pub Dt:
07/19/2012
Inventors:
Yong Koo LEE, In Duk HWANG, Tae Soo KIM, Jong Gun LEE, Seock Woo JANG, Chul Ho YUN
Title:
PARTICLE MEASURING APPARATUS AND MEASURING METHOD USING THE SAME
Assignment: 1
Reel/Frame:
027445/0189Recorded: 12/27/2011Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/21/2011
Exec Dt:
11/21/2011
Exec Dt:
11/21/2011
Exec Dt:
11/21/2011
Exec Dt:
11/21/2011
Exec Dt:
11/21/2011
Assignee:
416, MAETAN-DONG, YEONGTONG-GU, GYEONGGI-DO
SUWON-SI, KOREA, REPUBLIC OF
Correspondent:
SUGHRUE MION, PLLC
2100 PENNSYLVANIA AVENUE NW, SUITE 800
WASHINGTON, DC 20037
Assignment: 2
Reel/Frame:
060632/0598Recorded: 07/12/2022Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/13/2022
Assignee:
306, TECHNO 2-RO, YUSEONG-GU
DAEJEON, KOREA, REPUBLIC OF 34036
Correspondent:
LEX IP MEISTER, PLLC
5180 PARKSTONE DRIVE, SUITE 175
CHANTILLY, VA 20151

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