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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
9056383
Issue Dt:
06/16/2015
Application #:
13777829
Filing Dt:
02/26/2013
Publication #:
20140242879
Pub Dt:
08/28/2014
Inventors:
Benjamin Cherian, Boguslaw A. Swedek, Jun Qian, David J. Lischka, Jeffrey Drue David et al
Title:
PATH FOR PROBE OF SPECTROGRAPHIC METROLOGY SYSTEM
Assignment: 1
Reel/Frame:
030349/0512Recorded: 05/03/2013Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
DAVID, JEFFREY DRUE
Exec Dt:
04/03/2013
CHERIAN, BENJAMIN
Exec Dt:
04/03/2013
BENVEGNU, DOMINIC J.
Exec Dt:
04/05/2013
SWEDEK, BOGUSLAW A.
Exec Dt:
04/03/2013
OSTERHELD, THOMAS H.
Exec Dt:
04/03/2013
QIAN, JUN
Exec Dt:
04/05/2013
LI, THOMAS
Exec Dt:
04/03/2013
BENNETT, DOYLE E.
Exec Dt:
04/03/2013
LISCHKA, DAVID J.
Exec Dt:
04/04/2013
ZUNIGA, STEVEN M.
Exec Dt:
04/04/2013
Assignee:
APPLIED MATERIALS, INC.
3050 BOWERS AVENUE
SANTA CLARA, CALIFORNIA 95054
Correspondent:
DAVID J. GOREN
FISH & RICHARDSON P.C.
P.O.BOX 1022
MINNEAPOLIS, MN 55440-1022

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