Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
10/06/2015
|
Application #:
|
13071360
|
Filing Dt:
|
03/24/2011
|
|
Publication #:
|
|
Pub Dt:
|
03/22/2012
| | | | |
|
Inventor:
|
Tadashi MITSUI
|
|
Title:
|
PATTERN DEFECT INSPECTION USING DATA BASED ON SECONDARY ELECTRON FROM PATTERN
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 1-1, SHIBAURA 1-CHOME, MINATO-KU, |
| TOKYO, JAPAN |
|
|
|
|
| FINNEGAN HENDERSON ET AL. |
| 901 NEW YORK AVE., NW |
| WASHINGTON, DC 20001 |
|
|
Search Results as of:
05/08/2024 05:31 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
