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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/02/2016
Application #:
14164955
Filing Dt:
01/27/2014
Publication #:
Pub Dt:
08/07/2014
Inventors:
Abhishek KUMAR, Alexandre R. TUMLINSON, Rainer LEITGEB
Title:
SYSTEMS AND METHODS FOR SUB-APERTURE BASED ABERRATION MEASUREMENT AND CORRECTION IN INTERFEROMETRIC IMAGING
Assignment: 1
Reel/Frame:
032650/0610Recorded: 04/10/2014Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
04/04/2014
Exec Dt:
04/04/2014
Exec Dt:
04/04/2014
Assignee:
5160 HACIENDA DRIVE
DUBLIN, CALIFORNIA 94568-7562
Correspondent:
MICHAEL A. STALLMAN
MORRISON & FOERSTER LLP
425 MARKET STREET
SAN FRANCISCO, CA 94105

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