Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
01/03/2017
|
Application #:
|
14403010
|
Filing Dt:
|
11/21/2014
|
|
Publication #:
|
|
Pub Dt:
|
05/21/2015
| | | | |
|
Inventors:
|
Martin Jacobus Johan Jak, Armand Eugene Albert Koolen, Hendrik Jan Hidde Smilde
|
|
Title:
|
Metrology Method and Apparatus, Substrate, Lithographic System and Device Manufacturing Method
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| P.O. BOX 324 |
| VELDHOVEN, NETHERLANDS 5500 AH |
|
|
|
|
| STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C |
| 1100 NEW YORK AVENUE, N.W. |
| WASHINGTON, DC 20005 |
|
|
Search Results as of:
09/21/2024 07:50 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
