Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/07/2017
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Application #:
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14991780
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Filing Dt:
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01/08/2016
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Publication #:
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Pub Dt:
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05/05/2016
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Inventor:
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Daniel Piper
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Title:
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TEST STRUCTURE FOR DETERMINING OVERLAY ACCURACY IN SEMICONDUCTOR DEVICES USING RESISTANCE MEASUREMENT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 5509 N.W. PARKER STREET |
| CAMAS, WASHINGTON 98607 |
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| DUANE MORRIS LLP C/O MARK MARCELLI |
| 750 B STREET |
| SUITE 2900 |
| SAN DIEGO, CA 92101 |
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