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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/14/2017
Application #:
14835650
Filing Dt:
08/25/2015
Publication #:
Pub Dt:
03/02/2017
Inventors:
Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur
Title:
IDENTIFYING FAILURE INDICATING SCAN TEST CELLS OF A CIRCUIT-UNDER-TEST
Assignment: 1
Reel/Frame:
036814/0394Recorded: 10/16/2015Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/14/2015
Exec Dt:
09/14/2015
Exec Dt:
10/01/2015
Assignee:
690 EAST MIDDLEFIELD ROAD
MOUNTAIN VIEW, CALIFORNIA 94043
Correspondent:
RAJIV P. PATEL
FENWICK & WEST LLP
801 CALIFORNIA STREET
MOUNTAIN VIEW, CA 94041

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