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Patent Assignment Abstract of Title

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Total Assignments: 2

Patent #:	9671685	Issue Dt:	06/06/2017	Application #:	12976646	Filing Dt:	12/22/2010
Publication #:	20110161893	Pub Dt:	06/30/2011
Inventors:	CHIN-HSIANG LIN, Heng-Jen Lee, I-Hsiung Huang, Chun-Jen Chen, Rick Lai, Chih-Chiang Tu
Title:	LITHOGRAPHIC PLANE CHECK FOR MASK PROCESSING

Assignment: 1

Reel/Frame:

025536/0432

Recorded: 12/22/2010

Pages: 5

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

LIN, CHIN-HIANG

Exec Dt:

01/10/2010

LEE, HENG-JEN

Exec Dt:

01/06/2010

HUANG, I-HSIUNG

Exec Dt:

02/02/2010

TU, CHIH-CHIANG

Exec Dt:

02/08/2010

CHEN, CHUN-JEN

Exec Dt:

02/11/2010

LAI, RICK

Exec Dt:

02/09/2010

Assignee:

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

NO. 8, LI-HSIN RD 6

SCIENCE-BASED INDUSTRIAL PARK

HSIN-CHU, TAIWAN 300-77

Correspondent:

HAYNES AND BOONE, LLP

2323 VICTORY AVENUE

SUITE 700

DALLAS, TX 75219

Assignment: 2

Reel/Frame:

042351/0456

Recorded: 04/27/2017

Pages: 6

Conveyance:

CORRECTIVE ASSIGNMENT TO CORRECT THE SPELLING OF FIRST NAMED INVENTOR PREVIOUSLY RECORDED ON REEL 025536 FRAME 0432. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.

Assignor:

LIN, CHIN-HSIANG

Exec Dt:

01/10/2010

Assignee:

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

NO. 8, LI-HSIN RD 6

SCIENCE-BASED INDUSTRIAL PARK

HSIN-CHU, TAIWAN 300-77

Correspondent:

HAYNES AND BOONE, LLP

2323 VICTORY AVENUE

SUITE 700

DALLAS, TX 75219

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