Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/04/2017
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Application #:
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14381537
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Filing Dt:
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08/27/2014
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Publication #:
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Pub Dt:
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01/15/2015
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Inventors:
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Patrick Reynaud, Walter Schwarzenbach, Konstantin Bourdelle, Jean-Francois Gilbert
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Title:
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METHOD OF TESTING A SEMICONDUCTOR-ON-INSULATOR STRUCTURE AND APPLICATION OF SAID TEST TO THE FABRICATION OF SUCH A STRUCTURE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| CHEMIN DES FRANQUES |
| PARC TECHNOLOGIQUE DES FONTAINES |
| BERNIN, FRANCE 38190 |
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| TRASKBRITT, P.C. |
| P.O. BOX 2550 |
| SALT LAKE CITY, UT 84110 |
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