Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
10/03/2017
|
Application #:
|
14867226
|
Filing Dt:
|
09/28/2015
|
|
Publication #:
|
|
Pub Dt:
|
12/22/2016
| | | | |
|
Inventors:
|
Pradeep Vukkadala, Jaydeep Sinha, Jong-Hoon Kim
|
|
Title:
|
PROCESS-INDUCED ASYMMETRY DETECTION, QUANTIFICATION, AND CONTROL USING PATTERNED WAFER GEOMETRY MEASUREMENTS
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
|
|
|
|
| SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER |
| 14301 FNB PARKWAY |
| SUITE 220 |
| OMAHA, NE 68154-5299 |
|
|
Search Results as of:
06/22/2024 03:54 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
