Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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10/03/2017
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Application #:
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13516376
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Filing Dt:
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06/15/2012
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Publication #:
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Pub Dt:
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10/11/2012
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Inventors:
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Arnaud Favre, Julien Bounouar
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Title:
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Method and Device for Controlling the Manufacture of Semiconductor by Measuring Contamination
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 98, AVENUE DE BROGNY |
| ANNECY, FRANCE F-74000 |
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| DALY, CROWLEY, MOFFORD & DURKEE, LLP |
| 354A TURNPIKE STREET |
| SUITE 301A |
| CANTON, MA 02021-2714 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 98 AVENUE DE BROGNY |
| ANNECY, FRANCE 74009 |
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| OBLON, ET AL. |
| 1940 DUKE STREET |
| ALEXANDRIA, VA 22314 |
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